BUENO, R. C.; MARQUES, R. G.; DE SOUZA, R. A.; MACHADO, S. T. A Semiparametric Approach to Mitigating the Impact of Outliers in ROC Curve Generation for Image Analysis. Journal of the Brazilian Computer Society, [S. l.], v. 31, n. 1, p. 1320–1330, 2025. DOI: 10.5753/jbcs.2025.5288. Disponível em: https://journals-sol.sbc.org.br/index.php/jbcs/article/view/5288. Acesso em: 5 dec. 2025.